Proton Induced X-ray Emission Spectrometry, often abbreviated as PIXE, is an analytical technique used in materials science, geology, archaeology, and other fields to determine the elemental composition of a sample. PIXE involves the irradiation of a sample with a beam of protons, typically accelerated to high energies, causing the sample to emit characteristic X-rays. These X-rays arise from the excited inner shell vacancies created when protons interact with the atomic nuclei of the sample.
The emitted X-rays correspond to specific elements present in the sample, and their detection and analysis provide valuable information about the elemental composition and concentration within the sample. PIXE spectrometry can identify and quantify a wide range of elements, from light elements such as carbon and oxygen to heavy elements like uranium and lead.
The technique requires a specialized setup consisting of a high-energy proton accelerator, a sample chamber, and a detection system capable of capturing and analyzing the emitted X-rays. The X-ray signals are typically collected using energy-dispersive detectors, and the resulting data are processed to determine the elemental composition.
PIXE spectrometry offers numerous advantages, including its non-destructive nature, high sensitivity, and ability to analyze samples with a wide range of sizes and forms. It is especially useful for the analysis of thin films, trace elements, and small or precious samples. Additionally, PIXE can be used in combination with other analytical techniques to enhance the accuracy and depth of analysis, providing valuable insights into the chemical and structural properties of a material.
