Particle Induced X-ray Emission Spectrometry (PIXE) is an analytical technique used to determine the elemental composition of a sample. It involves bombarding the sample with high-energy particles, such as protons, electrons, or ions, causing the emission of characteristic X-rays from the sample. These emitted X-rays are then detected and analyzed to identify and quantify the elements present in the sample.
In PIXE spectrometry, the incoming energetic particles interact with the atoms in the sample, leading to the excitation and ionization of the sample's atoms. As these excited or ionized atoms return to their ground state, they emit X-rays with discrete energies characteristic of the elements present. These characteristic X-rays are collected using a detector, typically a solid-state silicon detector, which can accurately measure the energies and intensities of the emitted X-rays.
PIXE spectrometry has several advantages over other elemental analysis techniques. It is a non-destructive method, allowing for the analysis of valuable or irreplaceable samples. It has high sensitivity, capable of detecting elements in trace amounts down to parts-per-million or even parts-per-billion levels. It is also a multi-elemental technique, meaning it can determine the elemental composition of a wide range of samples.
PIXE spectrometry finds applications in diverse fields such as archaeology, art conservation, environmental studies, geology, and forensics, among others. It provides valuable information about the elemental composition of materials, aiding in the understanding of their origin, history, and properties.
